New era of smart inspection
NEO Intelligence
NEO intelligence is based on an innovative defect approach that relates to defect identification, as well as the creation of statistics by defect type. Local trend analyses are produced on the machine, with information presented in a user-friendly format.
Reduced dependence on human intervention was a key goal for this strategic development, which brings the smart factory concept ever closer.
SMART INSPECTION BENEFITS
Fast visual analysis of production
An innovative defect approach that relates to defect identification, as well as the creation of statistics by defect type. Local trend analyses are produced on the machine, with information presented in a user-friendly format.